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Microlithography and Metrology in Micromachining II

Microlithography and Metrology in Micromachining II 14-15 October, 1996, Austin, Texas - Proceedings / SPIE--the International Society for Optical Engineering

Paperback (13 Sep 1996)

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Book information

ISBN: 9780819422781
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 621.38152
DEWEY edition: 21
Language: English
Number of pages: 296
Weight: -1g