Microelectronic Circuits
Paperback
Published 27 Jan 2020
- $204.41
Microelectronic Manufacturing Yield, Reliability, and Failure Analysis 25-26 October 1995, Austin, Texas - Proceedings / SPIE--the International Society for Optical Engineering
Paperback (31 Dec 1995)
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Book information
| ISBN: | 9780819420015 |
| Publisher: | SPIE |
| Imprint: | SPIE |
| Pub date: | 31 Dec 1995 |
| DEWEY: | 621.381 |
| DEWEY edition: | 21 |
| Language: | English |
| Number of pages: | 284 |
| Weight: | 680g |
| Height: | 273mm |
| Width: | 216mm |
| Spine width: | 19mm |
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