Biometrics
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Published 20 Nov 2018
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Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III 1-2 October, 1997, Austin, Texas - SPIE Proceedings Series
Paperback (30 Jun 2006)
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Book information
| ISBN: | 9780819426482 |
| Publisher: | SPIE |
| Imprint: | SPIE |
| Pub date: | 30 Jun 2006 |
| DEWEY: | 621.381 |
| DEWEY edition: | 21 |
| Language: | English |
| Number of pages: | 198 |
| Weight: | 498g |
| Height: | 266mm |
| Width: | 209mm |
| Spine width: | 12mm |
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