Biometrics
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Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II 16-17 October, 1996, Austin, Texas - Proceedings / SPIE--the International Society for Optical Engineering
Paperback (12 Sep 1996)
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Book information
| ISBN: | 9780819422729 |
| Publisher: | SPIE |
| Imprint: | SPIE |
| Pub date: | 12 Sep 1996 |
| DEWEY: | 621.381 |
| DEWEY edition: | 21 |
| Language: | English |
| Number of pages: | 372 |
| Weight: | -1g |
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