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Methods of Measurement for Semiconductor Materials, Process Control, and Devices

Methods of Measurement for Semiconductor Materials, Process Control, and Devices Quarterly Report, January 1 to March 31, 1969 (Classic Reprint)

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Publisher's Synopsis

Excerpt from Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, January 1 to March 31, 1969

In the first report of this series [5] background information was given for the Program and for 15 of the tasks. In the second report [6] background information was included for three additional tasks. During this quarter work was begun on a single new task on gold-doped Silicon, which had been identified during the April, 1968, program review.

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Book information

ISBN: 9780656603190
Publisher: Fb&c Ltd
Imprint: Forgotten Books
Pub date:
Number of pages: 52
Weight: 82g
Height: 229mm
Width: 152mm
Spine width: 3mm