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Metallization

Metallization Performance and Reliability Issues for VLSI and ULSI ; 12-13 September 1991, San Jose, California - Proceedings / SPIE--the International Society for Optical Engineering

Paperback (01 Jan 1991)

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Book information

ISBN: 9780819407276
Publisher: SPIE
Imprint: SPIE
Pub date:
Language: English
Number of pages: 159
Weight: 408g
Height: 285mm
Width: 222mm
Spine width: 12mm