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Measurement Techniques for Radio Frequency Nanoelectronics

Measurement Techniques for Radio Frequency Nanoelectronics - The Cambridge RF and Microwave Engineering Series

Hardback (14 Sep 2017)

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Publisher's Synopsis

Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials.  Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconducting nanowires, graphene, and other two dimensional materials such as transition metal dichalcogenides  Gain practical insights into instrumentation, including on-wafer measurement platforms and scanning microwave microscopy  Discover how measurement techniques can be applied to solve real-world problems, in areas such as passive and active nanoelectronic devices, semiconductor dopant profiling, subsurface nanoscale tomography, nanoscale magnetic device engineering, and broadband, spatially localized measurements of biological materials Featuring numerous practical examples, and written in a concise yet rigorous style, this is the ideal resource for researchers, practicing engineers, and graduate students new to the field of radio frequency nanoelectronics.

About the Publisher

Cambridge University Press

Cambridge University Press dates from 1534 and is part of the University of Cambridge. We further the University's mission by disseminating knowledge in the pursuit of education, learning and research at the highest international levels of excellence.

Book information

ISBN: 9781107120686
Publisher: Cambridge University Press
Imprint: Cambridge University Press
Pub date:
DEWEY: 620.1157
DEWEY edition: 23
Language: English
Number of pages: 328
Weight: 790g
Height: 253mm
Width: 178mm
Spine width: 18mm