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Materials Science in Microelectronics, Volume 1: The Relationships Between Thin Film Processing and Structure

Materials Science in Microelectronics, Volume 1: The Relationships Between Thin Film Processing and Structure

2nd Edition

Hardback (21 Sep 2005)

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Publisher's Synopsis

Thin films play a key role in the material science of microelectronics, and the subject matter of thin-films divides naturally into two headings: processing / structure relationship, and structure / properties relationship.The first volume of Materials Science in Microelectronics focuses on the first relationship - that between processing and the structure of the thin-film. The state of the thin film's surface during the period that one monolayer exists - before being buried in the next layer - determines the ultimate structure of the thin film, and thus its properties. This volume takes into consideration the following potential influencing factors: crystal defects, void structure, grain structure, interface structure in epitaxial films, the structure of amorphous films, and reaction-induced structure.An ideal text or reference work for students and researchers in material science, who need to learn the basics of thin films.

Book information

ISBN: 9780080446400
Publisher: Elsevier Science
Imprint: Elsevier
Pub date:
Edition: 2nd Edition
DEWEY: 621.38152
DEWEY edition: 22
Language: English
Number of pages: 270
Weight: 530g
Height: 240mm
Width: 165mm
Spine width: 17mm