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Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II

Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II 29-30 October 2001, Boston, [Massachusetts] USA - SPIE Proceedings Series

Paperback (31 Jan 2002)

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Book information

ISBN: 9780819442956
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 681.25
DEWEY edition: 21
Number of pages: 236
Weight: -1g