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Machine Vision Applications in Industrial Inspection XII

Machine Vision Applications in Industrial Inspection XII 21-22 January, 2004, San Jose, California, USA - SPIE

Paperback (31 May 2004)

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Publisher's Synopsis

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Book information

ISBN: 9780819452061
Publisher: SPIE
Imprint: SPIE
Pub date:
Language: English
Number of pages: 204
Weight: 498g
Height: 279mm
Width: 215mm
Spine width: 6mm