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MTDT 2004

MTDT 2004 Records of the 2004 International Workshop on Memory Technology, Design and Testing : 9-10 August, 2004, San Jose, California, USA

Book (30 Sep 2004)

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Book information

ISBN: 9780769521930
Publisher: IEEE Computer Society
Imprint: IEEE Computer Society
Pub date:
DEWEY: 621.39732
DEWEY edition: 22
Language: English
Number of pages: 121
Weight: -1g