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Introduction to Spectroscopic Ellipsometry of Thin Film Materials

Introduction to Spectroscopic Ellipsometry of Thin Film Materials Instrumentation, Data Analysis and Applications

Paperback (13 Apr 2022)

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Publisher's Synopsis

Book information

ISBN: 9783527349517
Publisher: Wiley
Imprint: Wiley-VCH
Pub date:
DEWEY: 621.38152
DEWEY edition: 23
Language: English
Number of pages: 224
Weight: 414g
Height: 173mm
Width: 246mm
Spine width: 11mm