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International Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits

International Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits NUPAD V : Hilton Hawaiian Village, Honolulu, HI June 5-6, 1994

Hardback (15 Jun 2006)

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Book information

ISBN: 9780780318670
Publisher: Institute of Electrical and Electronics Engineers
Imprint: Institute of Electrical and Electronics Engineers
Pub date:
DEWEY: 621.3815011
DEWEY edition: 20
Language: English
Number of pages: 188
Weight: -1g
Height: 279mm
Width: 215mm
Spine width: 19mm