Paperback (31 Jan 1998)
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Out of stock
Fault-prone module identification; error detection and handling; test strategies; modelling reliability growth; system reliability; high reliability/operational profile; process and quality; test effectiveness; high reliability; and software reliability, feature in this book.
| ISBN: | 9780818682216 |
| Publisher: | IEEE Computer Society Press,U.S. |
| Imprint: | IEEE Computer Society Press,U.S. |
| Pub date: | 31 Jan 1998 |
| DEWEY: | 005.3 |
| Language: | English |
| Number of pages: | 100 |
| Weight: | -1g |
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