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International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro-, and Quantum Electronics

International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro-, and Quantum Electronics 13-15 May 1997, Kiev, Ukraine - SPIE Proceedings Series

Paperback (30 Jun 2006)

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Book information

ISBN: 9780819428080
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 621.381
DEWEY edition: 21
Language: English
Number of pages: 564
Weight: 1360g
Height: 266mm
Width: 209mm
Spine width: 38mm