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International Conference on Defects in Semiconductors 2013

International Conference on Defects in Semiconductors 2013 Proceedings of the 27th International Conference on Defects in Semiconductors, ICDS-2013, Bologna, Italy, 21-26 July 2013 - AIP Proceedings

Paperback (01 Jan 2014)

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Book information

ISBN: 9780735412156
Publisher: AIP Pubishing
Imprint: AIP Pubishing
Pub date:
Language: English