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Interferometry XVI. Techniques and Analysis

Interferometry XVI. Techniques and Analysis 13-15 August 2012. San Diego, California, United States - Proceedings of SPIE

Paperback (30 Aug 2012)

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    Publisher's Synopsis

    Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

    Book information

    ISBN: 9780819492104
    Publisher: SPIE
    Imprint: SPIE
    Pub date:
    DEWEY: 535.470287
    DEWEY edition: 23
    Number of pages: 420
    Weight: -1g
    Height: 229mm
    Width: 152mm

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