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Interferometry--Techniques and Analysis

Interferometry--Techniques and Analysis 20-21 July 1992, San Diego, California - Proceedings / SPIE--the International Society of Optical Engineering

Book (01 Jan 1993)

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Book information

ISBN: 9780819409287
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 535.40287
DEWEY edition: 20
Language: English
Number of pages: 288
Weight: 703g
Height: 285mm
Width: 222mm
Spine width: 25mm