Father Time
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Published 14 May 2024
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Interferometry--Surface Characterization and Testing 24 July 1992, San Diego, California - Proceedings / SPIE--the International Society for Optical Engineering
Paperback (30 Jun 2006)
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Book information
| ISBN: | 9780819409492 |
| Publisher: | SPIE |
| Imprint: | SPIE |
| Pub date: | 30 Jun 2006 |
| DEWEY: | 620.44 |
| DEWEY edition: | 20 |
| Language: | English |
| Number of pages: | 183 |
| Weight: | 454g |
| Height: | 280mm |
| Width: | 209mm |
| Spine width: | 12mm |
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