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Interferometric Metrology

Interferometric Metrology 20-21 August 1987, San Diego, California - SPIE

Book (01 Jan 1988)

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    Book information

    ISBN: 9780892528516
    Publisher: SPIE
    Imprint: SPIE
    Pub date:
    DEWEY: 621.3675
    DEWEY edition: 20
    Language: English
    Number of pages: 239
    Weight: -1g

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