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Integrated Circuit Test Engineering

Integrated Circuit Test Engineering Modern Techniques

2006

Paperback (22 Aug 2005)

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Publisher's Synopsis

Taking a three-pronged approach - test engineering from traditional-test, design and manufacturing view-points - Integrated Circuit Test Engineering encapsulates the subject as it stands today. After introductory background from basic testing rules to trends in technology, the reader learns about: fabrication processes; a complete range of detailed tests and procedures; how to design for testability; fault simulation; automatic test equipment and the economics of testing.

The text incudes:

 Worked examples and exercises, well-organized references and bibliography.

 An introduction to the use of various software and languages such as MATLAB®, Spice, Verilog®-HDL and VHDL.

 A series of experiments based on material downloaded from springeronline.com showing how to construct a hardware test arrangement for MS Windows PCs.

This book is a practical tool for advanced undergraduate and graduate electronic engineering students, a resource for their tutors and a guide for the practising electronic engineer.

Book information

ISBN: 9781846280238
Publisher: Springer London
Imprint: Springer
Pub date:
Edition: 2006
DEWEY: 621.381548
DEWEY edition: 22
Language: English
Number of pages: 362
Weight: 605g
Height: 235mm
Width: 155mm
Spine width: 21mm