Biometrics
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In-Line Characterization, Yield, Reliability, and Failure Analysis in Micro - Proceedings of SPIE
Paperback (23 Apr 2001)
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Book information
| ISBN: | 9780819441072 |
| Publisher: | SPIE Press |
| Imprint: | SPIE Press |
| Pub date: | 23 Apr 2001 |
| Language: | English |
| Number of pages: | 252 |
| Weight: | -1g |
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