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Image Processing and Pattern Recognition in Remote Sensing

Image Processing and Pattern Recognition in Remote Sensing 25-27 October, 2002, Hangzhou, China - Proceedings of SPIE

Paperback (30 Jun 2003)

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Book information

ISBN: 9780819446848
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 550.287
DEWEY edition: 22
Language: English
Number of pages: 328
Weight: 793g
Height: 266mm
Width: 209mm
Spine width: 19mm