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Image Processing, Analysis, Measurement, and Quality

Image Processing, Analysis, Measurement, and Quality 13-15 January 1988, Los Angeles, California : Part of SPSE's International Symposium and Exposition on Electronic Imaging Devices and Systems '88, Andras I. Lakatos, General Chair - Proceedings / SPIE

Book (01 Jan 1988)

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Book information

ISBN: 9780892529360
Publisher: The Society
Imprint: The Society
Pub date:
DEWEY: 621.367
DEWEY edition: 19
Language: English
Number of pages: 270
Weight: -1g