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Identification of Defects in Semiconductors

Identification of Defects in Semiconductors - Semiconductors and Semimetals

Hardback (01 May 1998)

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Publisher's Synopsis

Book information

ISBN: 9780127521596
Publisher: Elsevier Science
Imprint: Academic Press
Pub date:
DEWEY: 621.38152
DEWEY edition: 21
Language: English
Number of pages: 376
Weight: 800g
Height: 229mm
Width: 152mm
Spine width: 25mm