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Iddq Testing for CMOS VLSI

Iddq Testing for CMOS VLSI

Book (01 Sep 1994)

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Publisher's Synopsis

Provides coverage of IDDQ testing, including discussion of the correlation between physical defects and logical faults, and how IDDQ testing detects these defects. It should be useful as a reference for designers and test engineers.

Book information

ISBN: 9780890067260
Publisher: Artech House
Imprint: Artech House
Pub date:
DEWEY: 621.3950287
DEWEY edition: 20
Number of pages: 193
Weight: 399g
Height: 230mm
Width: 158mm
Spine width: 17mm