Hardback (31 Jul 1998)
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This workshop focused on issues such as the generalization and utilization of statistically significant measurements to characterise and validate VLSI processes, designs and equipment operations. Papers discuss areas including yield ramping methodology in pre-produciton phase.
| ISBN: | 9780780343382 |
| Publisher: | IEEE |
| Imprint: | IEEE |
| Pub date: | 31 Jul 1998 |
| DEWEY: | 621.38152 |
| DEWEY edition: | 21 |
| Language: | English |
| Number of pages: | 121 |
| Weight: | -1g |
| Height: | 279mm |
| Width: | 222mm |
| Spine width: | 12mm |
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