Paperback (30 Jan 2016)
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This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Follow the Data!
| ISBN: | 9781627081023 |
| Publisher: | ASM International |
| Imprint: | ASM International |
| Pub date: | 30 Jan 2016 |
| DEWEY: | 621.381 |
| DEWEY edition: | 23 |
| Language: | English |
| Number of pages: | 500 |
| Weight: | -1g |
| Height: | 229mm |
| Width: | 152mm |
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