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IEEE Symposium on Visual Analytics Science and Technology, 2008

IEEE Symposium on Visual Analytics Science and Technology, 2008 Proceedings, Columbus, Ohio, USA, October 21-October 23, 2008

Book (01 Jan 2008)

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Book information

ISBN: 9781424429356
Publisher: IEEE
Imprint: IEEE
Pub date:
DEWEY: 006.6
DEWEY edition: 22
Language: English
Number of pages: 222
Weight: -1g