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IEEE Recommended Practice for Latchup Test Methods for Cmos and Bicmos Integrated-Circuit Process Characterization
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Book information
| ISBN: | 9781559371520 |
| Publisher: | IEEE Publications,U.S. |
| Imprint: | IEEE Publications,U.S. |
| Pub date: | 01 Jan 1997 |
| Language: | English |
| Number of pages: | 36 |
| Weight: | 159g |
| Height: | 330mm |
| Width: | 260mm |
| Spine width: | 6mm |
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