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IEEE International Reliability Physics Symposium

IEEE International Reliability Physics Symposium

CD-ROM (31 May 2002)

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Publisher's Synopsis

This CD-ROM originates from the 2002 IEEE International Reliability Physics Symposium, and is concerned with electron devices. Its contents include: non volatile memory; dielectrics; hot carriers; assembly/packaging; device dielectrics; interconnects; product reliability; and device and process.

Book information

ISBN: 9780780373532
Publisher: I.E.E.E.Press
Imprint: I.E.E.E.Press
Pub date:
DEWEY: 621.3815
Language: English
Weight: -1g