Paperback (31 Jul 2000)
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Presents 36 contributions from the July 2000 workshop addressing electronic engineering concerns in the testing of electronics systems for the prevention of field failures. Eleven sessions addressed topics such as fault tolerance and on-line testing for reconfigurable systems, reliability issues in nanometer technologies and radiation effects, faul
| ISBN: | 9780769506463 |
| Publisher: | I.E.E.E.Press |
| Imprint: | I.E.E.E.Press |
| Pub date: | 31 Jul 2000 |
| DEWEY: | 621.392 |
| Language: | English |
| Number of pages: | 150 |
| Weight: | -1g |
| Height: | 266mm |
| Width: | 203mm |
| Spine width: | 12mm |
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