Book (15 Jun 2006)
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The 25 papers cover delay testing and test scheduling, scan and functional testing, system testing, quiescent current testing, analog and mixed-signal testing, core-based testing, fault simulation and field programmable gate array testing, challenges in deep sub-micron testing, high level tests, memory testing, BIST and concurrent testing, board te
| ISBN: | 9780769507019 |
| Publisher: | IEEE Computer Society Press |
| Imprint: | IEEE Computer Society Press |
| Pub date: | 15 Jun 2006 |
| DEWEY: | 621.381548 |
| DEWEY edition: | 21 |
| Language: | English |
| Number of pages: | 181 |
| Weight: | -1g |
| Height: | 273mm |
| Width: | 215mm |
| Spine width: | 12mm |
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