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High-Resolution X-Ray Scattering from Thin Films and Multilayers

High-Resolution X-Ray Scattering from Thin Films and Multilayers - Springer Tracts in Modern Physics

Book (30 Dec 1998)

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Publisher's Synopsis

This critical overview presents experimental methods for solving most frequent structural problems of mono-crystalline thin films and layered systems, including thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is intended as a reference for experimentalists who want to improve their knowledge on modern X-ray methods for thin film analysis.

Book information

ISBN: 9783540620297
Publisher: Springer
Imprint: Springer
Pub date:
DEWEY: 530.4175
DEWEY edition: 21
Language: English
Number of pages: 256
Weight: 589g
Height: 247mm
Width: 165mm
Spine width: 25mm