Biometrics
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High-Resolution Wavefront Control Methods, Devices, and Applications II : 1-2 August, 2000, San Diego, [California] USA - SPIE Proceedings Series
Paperback (30 Nov 2000)
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Book information
| ISBN: | 9780819437693 |
| Publisher: | SPIE |
| Imprint: | SPIE |
| Pub date: | 30 Nov 2000 |
| DEWEY: | 621.36 |
| DEWEY edition: | 21 |
| Language: | English |
| Number of pages: | 288 |
| Weight: | -1g |
| Height: | 230mm |
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