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High Resolution Electron Microscopy of Defects in Materials

High Resolution Electron Microscopy of Defects in Materials Symposium Held April 16-18, 1990, San Francisco, California, U.S.A - Materials Research Society Symposium Proceedings

Hardback (10 Aug 1990)

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Publisher's Synopsis

Topics covered in this volume include point defects and aggregates, dislocations and linear defects, grain boundaries and extended planar defects, surfaces and small particles, defect-controlled phase transformations and reactions and amorphous materials.

About the Publisher

Cambridge University Press

Cambridge University Press dates from 1534 and is part of the University of Cambridge. We further the University's mission by disseminating knowledge in the pursuit of education, learning and research at the highest international levels of excellence.

Book information

ISBN: 9781558990722
Publisher: Materials Research Society
Imprint: Cambridge University Press
Pub date:
DEWEY: 620.11299
DEWEY edition: 20
Language: English
Number of pages: 391
Weight: 1000g
Height: 231mm
Width: 160mm
Spine width: 27mm