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Growth, Evolution and Properties of Surfaces, Thin Films and Self-Organized Structures

Growth, Evolution and Properties of Surfaces, Thin Films and Self-Organized Structures Symposium Held November 27- December 1, 2000, Boston, Massachusetts, U.S.A - Materials Research Society Symposium Proceedings

Hardback (20 Sep 2001)

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Publisher's Synopsis

This book emphasizes the broad scientific and technological interest in surfaces, thin films and self-organized structures. A significant portion of papers addresses materials and devices at the nanoscale, including work on self-organized structures as well as nanopatterned thin-film structures. Materials research in three-dimensional (layer growth), two-dimensional (surfaces, interfaces), one-dimensional (quantum wires, point contacts), and zero-dimensional (quantum dots) objects are covered. Discussions span nucleation, island and pattern formation, interfacial properties, formation of quantum dots and quantum wires, defect kinetics, atomic migration, effects of stress and strain, electromigration, pulsed- laser deposition, vapor-phase epitaxy, CVD, MOCVD, PECVD, LPCVD, MBE, alloy formation, Monte Carlo simulation, molecular dynamics studies, atomistic simulation, atomically flat surfaces, surface and interfacial roughening, and faceting. Materials discussed include metals, semiconductors, oxides and other insulators, organics, and biomaterials.

About the Publisher

Cambridge University Press

Cambridge University Press dates from 1534 and is part of the University of Cambridge. We further the University's mission by disseminating knowledge in the pursuit of education, learning and research at the highest international levels of excellence.

Book information

ISBN: 9781558995581
Publisher: Materials Research Society
Imprint: Cambridge University Press
Pub date:
DEWEY: 530.427
DEWEY edition: 21
Language: English
Number of pages: 636
Weight: 1000g
Height: 228mm
Width: 158mm
Spine width: 31mm