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Gettering and Defect Engineering in Semiconductor Technology XI

Gettering and Defect Engineering in Semiconductor Technology XI - Solid State Phenomena

Audio-visual / Multimedia Item (01 Oct 2005)

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Publisher's Synopsis

Volume is indexed by Thomson Reuters CPCI-S (WoS).This proceedings volume contains 126 contributions from the 11th international meeting on Gettering and Defect Engineering in Semiconductor Technology GADEST 2005 held at "La Badine" at the Giens peninsula south of France.

Book information

ISBN: 9783035719819
Publisher: Trans Tech Publications Ltd
Imprint: Trans Tech Publications
Pub date:
Language: English
Number of pages: 830
Weight: -1g
Height: 142mm
Width: 125mm
Spine width: 10mm