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Gate Stack Technology for End-of-Roadmap Devices in Logic, Power, and Memory : April 1-5, 2013, San Francisco, California, USA

Gate Stack Technology for End-of-Roadmap Devices in Logic, Power, and Memory : April 1-5, 2013, San Francisco, California, USA - Materials Research Society Symposium Proceedings

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Book information

ISBN: 9781632661432
Publisher: Materials Research Society
Imprint: Materials Research Society
Pub date:
DEWEY: 621.395
DEWEY edition: 23
Language: English
Number of pages: 47