Hardback (16 Nov 2009)
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Out of stock
Fundamental Principles of Engineering Nanometrology provides a comprehensive overview of engineering metrology and how it relates to micro and nanotechnology (MNT) research and manufacturing. By combining established knowledge with the latest advances from the field, it presents a comprehensive single volume that can be used for professional reference and academic study.
| ISBN: | 9780080964546 |
| Publisher: | Elsevier Science |
| Imprint: | William Andrew |
| Pub date: | 16 Nov 2009 |
| DEWEY: | 620.50287 |
| DEWEY edition: | 22 |
| Language: | English |
| Number of pages: | 321 |
| Weight: | 886g |
| Height: | 242mm |
| Width: | 199mm |
| Spine width: | 22mm |
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