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Field Ion Microscopy;

Field Ion Microscopy; Principles and Applications

Book (01 Jan 1969)

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Book information

ISBN: 9780444000620
Publisher: American Elsevier Pub. Co.
Imprint: American Elsevier Pub. Co.
Pub date:
DEWEY: 578.1
Language: English
Number of pages: 314
Height: 230mm
Width: 150mm