Fault-Tolerance and Reliability Techniques for High-Density Random-Access Memories : Abhishek Chakraborty (author), : 9780130084651 : Blackwell's

Fault-Tolerance and Reliability Techniques for High-Density Random-Access Memories - Prentice Hall Modern Semiconductor Design Series

Hardback (24 Jun 2002)

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ISBN:	9780130084651
Publisher:	Pearson Education
Imprint:	Prentice Hall
Pub date:	24 Jun 2002
DEWEY:	621.3973
DEWEY edition:	21
Language:	English
Number of pages:	448
Weight:	830g
Height:	243mm
Width:	183mm
Spine width:	22mm

Fault-Tolerance and Reliability Techniques for High-Density Random-Access Memories - Prentice Hall Modern Semiconductor Design Series

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