Publisher's Synopsis
A straightforward and accessible approach to the subject of failure in electronic components, centering largely around semiconductor devices. The authors have drawn on their considerable experience in this field to produce an authoritative work which identifies possible sources of failure in semiconductor devices and discusses methods for the detection and elimination of the same. The physics of failure mechanisms are covered in detail, from the semiconductor die itself to its packaging and interconnections. Other topics covered include accelerated lifetesting, reliability modelling and estimating, assurance and screening techniques.
