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Fabrication, Testing, and Reliability of Semiconductor Lasers II

Fabrication, Testing, and Reliability of Semiconductor Lasers II 13-14 February, 1997, San Jose, California - Proceedings / SPIE--the International Society for Optical Engineering

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Book information

ISBN: 9780819424150
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 621.366
DEWEY edition: 21
Language: English
Number of pages: 176
Weight: 454g
Height: 279mm
Width: 222mm
Spine width: 12mm