2nd completely Revised and enl Edition
Hardback (02 Jan 2007)
Not available for sale
Out of stock
This new and updated edition features a new applications section, reflecting the many breakthroughs in the field over the last years. It provides a set of computational models that describe the physical phenomena associated with atomic force microscopy and related technologies.
| ISBN: | 9783527406173 |
| Publisher: | Wiley-VCH |
| Imprint: | Wiley-VCH |
| Pub date: | 02 Jan 2007 |
| Edition: | 2nd completely Revised and enl Edition |
| DEWEY: | 502.825 |
| DEWEY edition: | 22 |
| Language: | English |
| Number of pages: | 310 |
| Weight: | 721g |
| Height: | 246mm |
| Width: | 178mm |
| Spine width: | 21mm |
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