Publisher's Synopsis
This book/software edition provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. Its self–contained presentation spares researchers the valuable time spent hunting through the technical literature in search of prior theoretical results required to understand the models presented. Mathematica code for all examples is included both in the book and at the accompanying ftp site, affording the freedom to change, at will, the values and parameters of specific problems or even modify the programs themselves to suit various modeling needs.
Exploring Scanning Probe Microscopy with Mathematica is both a solid professional reference and an advanced–level text, beginning with scanning probe microscopy basics and moving on to cutting–edge techniques, experiments, and theory. In the section devoted to atomic force microscopy, Dr. Sarid describes the mechanical properties of cantilevers, atomic force microscope tip–sample interactions, and cantilever vibration characteristics. This is followed by an in–depth treatment of theoretical and practical aspects of tunneling phenomena, including metal–insulator–metal tunneling and Fowler–Nordheim field emission. The final section features chapters covering density of states in arbitrary dimensions, quantum wells and dots, and electrostatics.
