Publisher's Synopsis
Volume is indexed by Thomson Reuters CPCI-S (WoS).X-ray powder diffraction is a long-established and invaluable technique which is widely applied to the characterization of crystalline materials. The method has traditionally been used for phase identification, quantitative analysis and for the determination of structural imperfections. In recent years however, its use has been extended into exciting new areas such as the extraction of three-dimensional microstructural properties.
