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Encounter with Chaos

Encounter with Chaos Self-Organized Hierarchical Complexity in Semiconductor Experiments

Hardback (05 Dec 1992) | German

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Publisher's Synopsis

Book information

ISBN: 9783540556473
Publisher: Springer Berlin Heidelberg
Imprint: Springer
Pub date:
DEWEY: 530.15
Language: German
Number of pages: 289
Weight: 590g
Height: 216mm
Width: 138mm