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Electronics Reliability and Measurement Technology: Nondestructive Evaluation

Electronics Reliability and Measurement Technology: Nondestructive Evaluation

Hardback (31 Dec 1998)

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Publisher's Synopsis

This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.

Book information

ISBN: 9780815511717
Publisher: Elsevier Science
Imprint: William Andrew
Pub date:
DEWEY: 621.3810287
DEWEY edition: 19
Language: English
Number of pages: 128
Weight: 490g
Height: 254mm
Width: 178mm
Spine width: 9mm