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Electron and Ion Microscopy and Microanalysis

Electron and Ion Microscopy and Microanalysis Principles and Applications - Optical Engineering

2nd Edition, Revised and expandEdition

Hardback (25 Jul 1991)

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Publisher's Synopsis

The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

Book information

ISBN: 9780824785567
Publisher: CRC Press
Imprint: CRC Press
Pub date:
Edition: 2nd Edition, Revised and expandEdition
DEWEY: 502.825
DEWEY edition: 20
Language: English
Number of pages: 837
Weight: 1588g
Height: 279mm
Width: 216mm
Spine width: 45mm